RFR: 8318827: RISC-V: Improve readability of fclass result testing [v3]

[Feilong Jiang]

On Thu, 26 Oct 2023 15:35:49 GMT, Feilong Jiang <fjiang at openjdk.org> wrote:

>> Hi, please consider.
>> 
>> Currently, we test results of `fclass` instruction with hard-coded bits which has bad readability. This patch adds an enumeration of the flcass mask bits for ease of use.
>> 
>> Testing:
>> 
>> - [x] tier1 with release build
>
> Feilong Jiang has updated the pull request with a new target base due to a merge or a rebase. The incremental webrev excludes the unrelated changes brought in by the merge/rebase. The pull request contains four additional commits since the last revision:
> 
>  - Merge branch 'master' of https://github.com/openjdk/jdk into riscv-fclass-mask
>  - remove 'fclass_' prefix
>  - adjust enum name style
>  - Add FCLASS_MASK enum for better readability

tier1 tests passed, going to integrate then.

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PR Comment: https://git.openjdk.org/jdk/pull/16362#issuecomment-1784056411