RFR: 8325259: Serial: Inline OldGenScanClosure during Young GC

Albert Mingkun Yang ayang at openjdk.org
Mon Feb 5 23:50:54 UTC 2024


Simple inlining oop closure during card-scanning of young-gc.

Test: using the attached card-scanning-stressing benchmark, ~5x improvement (in terms of young-gc pause time) is observed on my box.

-------------

Commit messages:
 - s1-inline

Changes: https://git.openjdk.org/jdk/pull/17711/files
 Webrev: https://webrevs.openjdk.org/?repo=jdk&pr=17711&range=00
  Issue: https://bugs.openjdk.org/browse/JDK-8325259
  Stats: 200 lines in 8 files changed: 87 ins; 97 del; 16 mod
  Patch: https://git.openjdk.org/jdk/pull/17711.diff
  Fetch: git fetch https://git.openjdk.org/jdk.git pull/17711/head:pull/17711

PR: https://git.openjdk.org/jdk/pull/17711


More information about the hotspot-gc-dev mailing list