RFR: 8325259: Serial: Inline OldGenScanClosure during Young GC
Albert Mingkun Yang
ayang at openjdk.org
Mon Feb 5 23:50:54 UTC 2024
Simple inlining oop closure during card-scanning of young-gc.
Test: using the attached card-scanning-stressing benchmark, ~5x improvement (in terms of young-gc pause time) is observed on my box.
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Commit messages:
- s1-inline
Changes: https://git.openjdk.org/jdk/pull/17711/files
Webrev: https://webrevs.openjdk.org/?repo=jdk&pr=17711&range=00
Issue: https://bugs.openjdk.org/browse/JDK-8325259
Stats: 200 lines in 8 files changed: 87 ins; 97 del; 16 mod
Patch: https://git.openjdk.org/jdk/pull/17711.diff
Fetch: git fetch https://git.openjdk.org/jdk.git pull/17711/head:pull/17711
PR: https://git.openjdk.org/jdk/pull/17711
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