RFR: 8325259: Serial: Inline OldGenScanClosure during Young GC [v3]

[Albert Mingkun Yang]

> Simple inlining oop closure during card-scanning of young-gc.
> 
> Test: using the attached card-scanning-stressing benchmark, ~5x improvement (in terms of young-gc pause time) is observed on my box.

Albert Mingkun Yang has updated the pull request with a new target base due to a merge or a rebase. The incremental webrev excludes the unrelated changes brought in by the merge/rebase. The pull request contains six additional commits since the last revision:

 - review
 - reviw
 - reviw
 - Merge branch 'master' into s1-inline
 - review
 - s1-inline

-------------

Changes:
  - all: https://git.openjdk.org/jdk/pull/17711/files
  - new: https://git.openjdk.org/jdk/pull/17711/files/0b90e68e..ac74cdef

Webrevs:
 - full: https://webrevs.openjdk.org/?repo=jdk&pr=17711&range=02
 - incr: https://webrevs.openjdk.org/?repo=jdk&pr=17711&range=01-02

  Stats: 3386 lines in 137 files changed: 2471 ins; 557 del; 358 mod
  Patch: https://git.openjdk.org/jdk/pull/17711.diff
  Fetch: git fetch https://git.openjdk.org/jdk.git pull/17711/head:pull/17711

PR: https://git.openjdk.org/jdk/pull/17711