RFR: 8325259: Serial: Inline OldGenScanClosure during Young GC [v3]

[Albert Mingkun Yang]

On Wed, 7 Feb 2024 14:14:24 GMT, Albert Mingkun Yang <ayang at openjdk.org> wrote:

>> Simple inlining oop closure during card-scanning of young-gc.
>> 
>> Test: using the attached card-scanning-stressing benchmark, ~5x improvement (in terms of young-gc pause time) is observed on my box.
>
> Albert Mingkun Yang has updated the pull request with a new target base due to a merge or a rebase. The incremental webrev excludes the unrelated changes brought in by the merge/rebase. The pull request contains six additional commits since the last revision:
> 
>  - review
>  - reviw
>  - reviw
>  - Merge branch 'master' into s1-inline
>  - review
>  - s1-inline

Thanks for review.

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PR Comment: https://git.openjdk.org/jdk/pull/17711#issuecomment-1934473663