Integrated: 8325259: Serial: Inline OldGenScanClosure during Young GC

[Albert Mingkun Yang]

On Mon, 5 Feb 2024 17:58:07 GMT, Albert Mingkun Yang <ayang at openjdk.org> wrote:

> Simple inlining oop closure during card-scanning of young-gc.
> 
> Test: using the attached card-scanning-stressing benchmark, ~5x improvement (in terms of young-gc pause time) is observed on my box.

This pull request has now been integrated.

Changeset: 0ea75b28
Author:    Albert Mingkun Yang <ayang at openjdk.org>
URL:       https://git.openjdk.org/jdk/commit/0ea75b28d47a483eee4d156c9f6df4e68bd40117
Stats:     220 lines in 8 files changed: 97 ins; 111 del; 12 mod

8325259: Serial: Inline OldGenScanClosure during Young GC

Reviewed-by: stefank, tschatzl

-------------

PR: https://git.openjdk.org/jdk/pull/17711