RFR: Mark Leyden tests that require artifacts with "external-dep"

[Ioi Lam]

On Thu, 5 Sep 2024 17:38:41 GMT, Aleksey Shipilev <shade at openjdk.org> wrote:

> [JDK-8323717](https://bugs.openjdk.org/browse/JDK-8323717) added a new keyword that marks tests that require external artifacts. This allows skipping the tests that would definitely fail without artifact resolution. This PR marks the new Leyden tests.
> 
> Tested with:
> 
> 
> $ JTREG_KEYWORDS='!external-dep' CONF=linux-x86_64-server-fastdebug make test TEST=runtime/cds/appcds
> 
> ==============================
> Test summary
> ==============================
>    TEST                                              TOTAL  PASS  FAIL ERROR   
>    jtreg:test/hotspot/jtreg/runtime/cds/appcds         288   288     0     0   
> ==============================

LGTM. I didn't know of such a key (used by hotspot/jtreg/applications/scimark/Scimark.java, etc). Thanks for fixing it.

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Marked as reviewed by iklam (Committer).

PR Review: https://git.openjdk.org/leyden/pull/14#pullrequestreview-2290802609