Integrated: Mark Leyden tests that require artifacts with "external-dep"

[Aleksey Shipilev]

On Thu, 5 Sep 2024 17:38:41 GMT, Aleksey Shipilev <shade at openjdk.org> wrote:

> [JDK-8323717](https://bugs.openjdk.org/browse/JDK-8323717) added a new keyword that marks tests that require external artifacts. This allows skipping the tests that would definitely fail without artifact resolution. This PR marks the new Leyden tests.
> 
> Tested with:
> 
> 
> $ JTREG_KEYWORDS='!external-dep' CONF=linux-x86_64-server-fastdebug make test TEST=runtime/cds/appcds
> 
> ==============================
> Test summary
> ==============================
>    TEST                                              TOTAL  PASS  FAIL ERROR   
>    jtreg:test/hotspot/jtreg/runtime/cds/appcds         288   288     0     0   
> ==============================

This pull request has now been integrated.

Changeset: d23b9f2d
Author:    Aleksey Shipilev <shade at openjdk.org>
Committer: Ioi Lam <iklam at openjdk.org>
URL:       https://git.openjdk.org/leyden/commit/d23b9f2d5e3523cc547337da59327ed86a6057a3
Stats:     16 lines in 4 files changed: 16 ins; 0 del; 0 mod

Mark Leyden tests that require artifacts with "external-dep"

Reviewed-by: iklam

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PR: https://git.openjdk.org/leyden/pull/14