<AWT Dev> Integrated: 8255800: Raster creation methods need some specification clean up

[Phil Race]

On Fri, 26 Mar 2021 19:53:44 GMT, Phil Race <prr at openjdk.org> wrote:

> https://bugs.openjdk.java.net/browse/JDK-8255800 could have been a one line spec clean up but
> it didn't take a lot of looking to realize there were many more inconsistencies between spec and implementation.
> I've spent a lot of time on what is just small number of factory methods in Raster because there are so
> many possible exceptions and in some cases they rely on other API they call to generate exceptions and
> these may have not been documented or documented acc. to some long lost behavior.
> I've mostly tried to ONLY change spec. But I couldn't help myself when some checks were missed that
> ended up with bizarre and dubious behavior - throwing NegativeArrayIndexException which just about
> always has to be an internal bug !
> 
> The supplied test passes on JDK 16 as well as this code, because the (relatively) small number of
> cases where JDK 16 threw NegativeArrayIndexException are caught and allowed only for releases < 17
> So where you see those in the test it corresponds to the behavioral changes from NegativeArrayIndexException
> to IllegalArgumentException.
> JCK conformance tests still pass so they must not test those conditions.

This pull request has now been integrated.

Changeset: adb860ec
Author:    Phil Race <prr at openjdk.org>
URL:       https://git.openjdk.java.net/jdk/commit/adb860ec
Stats:     1494 lines in 5 files changed: 1424 ins; 35 del; 35 mod

8255800: Raster creation methods need some specification clean up

Reviewed-by: serb

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PR: https://git.openjdk.java.net/jdk/pull/3223